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PXIe-4499, 204.8 kS/s, 114 dB, 4 Gains, AC/DC-Coupled, 16-Input PXI Sound and Vibration Module
781370-01
204.8 kS/s, 114 dB, 4 Gains, AC/DC-Coupled, 16-Input PXI Sound and Vibration Module - The PXIe‑4499 is designed for high‑channel‑count sound and vibration applications. With 24-bit analog inputs and IEPE constant current signal conditioning, the PXIe‑4499 is ideal for making precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. The PXIe‑4499 delivers simultaneous sample on all channels. In addition, the PXIe‑4499 includes built-in ant...show more -
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Portal and Field Probe Solution
SWAT WiTrak
Alethea Communications Technologies Pvt Ltd
SWAT WiTrak is a remotely managed Portal and Field Probe solution that generates 4 to 32 full functionality clients from each device. Probes, can be managed and configured from the portal, Runs Real Applications, Supports different Security Options and Executes pre-defined test sequences. The portal allows the user to generate actionable reports and export raw logs for further analysis.
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PCI High Density Pecision Resistor Card, 6-Channel, 3.5Ω To 1.51MΩ
50-298-044
The 50-298-044 is a high density programmable resistor card with 6 channels which can be set between 3.5Ω and 1.51MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Compact Antenna Test Range
700.00 MHZ – 110000.00 MHZ
A Compact Antenna Test Range (CATR) allows electrically large antennas to be measured at a significantly shorter distance than would be necessary in a traditional far-field test range. Compact ranges use a source antenna (feed) to radiate a spherical wave in the direction of a parabolic reflector, collimating it into a planar wave for aperture illumination of a Device under Test (DUT). It's lowest operational frequency is determined by the size of the reflector, its edge treatment and the absorb...show more -
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 31.5Ω
40-253-010
The 40-253-010 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Walk InDrive In Chamber
Shanghai Morningtest Environmental Chambers Co.,Ltd.
Walk in/Drive in chambers can make test for large components, finished products like automobile.According to different test requirement and application, walk in chamber could divide into 2 types: Welded walk-in chamber and Modular walk-in chamber.
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GUI Tester
Squish
Testing the user interface of today's applications is a very complex and error-prone task. Automating this task is challenging, but approached correctly very rewarding. Squish is the leading cross-platform/cross-technology GUI test automation tool for functional GUI regression tests. Many companies in all kinds of industries all over the world use Squish to drastically cut down the time spent on GUI testing software releases while increasing the quality of their applications.
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Anite Application Testing
Verify higher level protocols and application enablers for a more effective roll-out of LTE-IMS based services to end-usersPerform rapid and cost-effective application testing associated with device acceptance test plans mandated by major mobile operators such as China Mobile, Verizon Wireless, AT&T and T-MobileGain access to comprehensive IMS LTE test plans mandated by standardization organizations such as GCF and PTCRB
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Advanced Power System - DC Power Supply, 9 V, 200 A, 2000 W
N6970A
The N6970A is designed for automated test equipment (ATE) applications where high performance is critical.
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System Control Modules for 34980A
The 34980A System and Control modules provide additional measurement and control capabilities that are typically used in test applications. Choose from modules that include digital I/O with programmable polarity, D/A converter with onboard memory to create waveforms, and frequency counter/totalizers.
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New Car Battery Tester
Hangzhou Xun Anda Electrical Co., Ltd.
1. Test application: 12V/6V batteries test and 12V Starting /Charging system test.2. Test battery type: regular liquid, AGM battery, GEL battery.3. CCA test range: 40~2000CCA (SAE).4. Voltage test range: 1.5-15V.5. Display SOH (state of health), SOC(state of charge).6. Test for multiple battery standards: SAE, DIN, EN, IEC, CA.7. Graphic LCD display with back light, LCD brightness adjustable.8. Multigle language operation: English, Chinese, Germany, French, Spanish.9. Intergrated thermal printer to print test reports.10. Thermal printer paper roll is 58mm width and 7.5m long.
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High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover m...show more -
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300-Watt AC/DC Power Supply, 6U VME
Model 56SQ2
NAI’s 56SQ2 is a 300 Watt AC/DC Power Supply that uses two slots in a standard VME chassis. It is conduction-cooled through the card edge/wedgelock. This power supply accepts either a single- or three-phase input and provides up to 5 standard VME outputs plus standby at 300 Watts. It is designed for VME and general purpose applications. An onboard microcontroller allows for design flexibility.Standard features include continuous Background Built-in-Test (BIT); remote error sensing; holdup time; ...show more -
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Software
Digilent’s proprietary software solutions enable you to communicate with our system boards and a wide assortment of logic devices and use our available analog and digital test & measurement instruments. Refined by customer feedback for years, these powerful and FREE software applications allow you to fully customize your project, from creating and modifying designs for your system board to custom scripting of instruments for capturing, recording, analyzing, and generating mixed signal and mixed domain waveforms.
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Antenna, Biconical
EM-6917B-1 | 30 MHz To 3 GHz
The EM-6917B-1, a hybrid combination of the industry standard biconical and log periodic antennas, delivers an unmatched combination of frequency coverage and high power handling capability. Featuring exceptionally broad frequency coverage of 26 MHz to 3 GHz, the EM-6917B-1 eliminates the need for adjustments or switching antennas in most test applications up to 3 GHz, and it does so without compromising power handling capability for transmit applications.
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PCI Precision Resistor Card 3-Channel, 3Ω To 2.97MΩ
50-297-151
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Design & Test Software
Industry-Leading Design, Emulation, and Test Software.Harness the power of digital twins, artificial intelligence, and automation to streamline workflows, break down silos, and accelerate test cycles.Find out why so many innovators trust Keysight to build their next breakthrough. With software spanning electronic design automation (EDA), instrument control, emulators, IT operations, and application delivery, your next project's only limitation is what you dare to dream.
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PXI-2799, 40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module
782359-01
40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module - The PXI‑2799 is a general-purpose single‑pole double‑throw (SPDT) switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2799 is also well-suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784192-01
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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Battery Test Equipment
Improper functioning of battery systems installed in utilities, power plants, telecommunication systems, industrial applications and etc., can cause severe failures of the supported equipment and loss of critical information. Therefore, the battery test verifies their actual SOC (State of Charge) or SOH (State of Health) and prevents unwanted scenarios which could result in a significant budget loss as well as endanger of human lives.DV Power battery test equipment is able to perform the followi...show more -
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 925Ω
50-297-121
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Embedded Software
From basics like boot firmware, built-in-test, and operating system support to CERT bootloaders and intrinsic security, Abaco gives developers the tools to maximize their hardware investment and develop applications on a solid foundation.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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Noise Generator
NG 600
The NG 500 noise generator is an external module with dual power supply for different applications: to calibrate filters, switchboards, to the distance of a fault caused by the impedance mismatch, to test the cable efficiency.
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Advanced Power System: Dynamic DC Power Supply, 60 V, 33 A, 2000 W
N7973A
The N7973A is designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Power Temperature Cycling
Typically, this test would be selected when during its normal operating activity, the device is subjected to high temperature excursions and is required to power on and off at all temperatures. The power and temperature cycling test will determine the ability of a device to withstand exposure to such temperature extremes with operating biases periodically applied and removed. The worst case conditions expected in a typical; application will be simulated.
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Battery Voltage Recorder
BVR Series
Battery voltage recorders from BVR series are designed to serve as a support tool for cell voltage measurement during battery capacity testing.During capacity testing, cell voltage, temperature, inter-cell connection voltage, and specific gravity should be measured in order to determine failling cells in the string that should be replaced.Furthermore, IEEE standards for stationary batteries applications stipulate periodical measurement of overall string voltage, as well as cell voltage and tempe...show more -
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Multifunction Instrument for Education and Training
LabXplorer
LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 127 Ohm
50-294-012
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
